Next Generation Electron Momentum Spectrometer for Small Spot ARPES and Momentum Microscopy
The KREIOS 150 is a new generation of electron spectrometers for high performance ARPES and PEEM. The unique lens system combines an immersion lens for PEEM operation with a hemispherical energy analyzer scanning system for unrivaled ARPES measurements. Its lens system acquires the full half sphere of the electron emission for ultimate angular acceptance of 180°.
The KREIOS 150 displays energy vs k-vector or energy vs spatial information directly on the detector. With the scanning lens it is possible to measure a full 3D dataset for ARPES or energy filtered PEEM. The lens system features apertures to refine the k-space into high contrast and dark field PEEM, as well as field apertures to select a spatial region for µ-ARPES down to 2 µm field of view. The kinetic energy up to 1500 eV allows XPS and XPEEM measurements. With the new CMOS detector, the KREIOS 150 is the most performing ARPES analyzer available.
With a 2D CMOS detector it shows outstanding performance in count rate, linearity and a true pulse counting mechanism. It combines a state-of-the-art lens system with a proven hemisphere design for highest transmission and resolution.
The energy analyzer section is equipped with 8 customizable entrance and 3 exit slits. For highest energy and mapping resolution the entrance slit can be chosen down to 50 µm. The analyzer comes with a highly stable power supply, for best performance in a wide kinetic energy range.
This analyzer features the spectroscopy mode for data acquisition. For momentum microscopy a special MM and MM Twin version is available.
The KREIOS 150 allows to aquire photoemission data with a very large field of view. Thanks to the extraction field the full photoemission horizon is collected. The integarted momentum deflectors let you then scan teh full 3D valence band structure.
In PEEM mode, a real space image of the surface is aquired in energy dispersive mode. Line by line, a complete eneryg filtered PEEM image is aquired, whcih can be used to identify ares of interest on the sample. Here a secondary electron image of a chessboard test sample (Au/Si) is shown, showing best resolution <50 nm.
The KREIOS 150 was used for laboratory based XPEEM studies using a µFOCUS 500 monochromated x-ray source. The chessboard test sample (Au/Si) was measured on the Au 4f core level, revealinbg a clear chemcial contrast with respect to the substrate.
Thanks to the high transmission of the PEEM lens combined with a hemispherical energy filter, teh KREIOS 150 is an ideal instrument for cpmbined chemical and electronic structure analysis.
< 5 meV
< 0.1° for 0.1 mm emission spot for He I
0.008 Å-1 for 0.1 mm emission spot @ He I
±90° full cone
|Smallest Acceptance Spot
|XPS Count Rates UHV
1285 x 730 (with Channel Binning)
|Kinetic Energy Range
|Angular Resolved Modes
1-200 eV Continuously Adjustable
Double µ-Metal Shielding
PEEM Mode, Momentum Resolved Mode
Snapshot Mode, Sweeping Mode
2D CMOS Detector with Spin Option
8 entrance and 3 exit slits and iris aperture
13% of Pass Energy
> 3.5 keV, 29 keV on lens system
HSA + for KREIOS
10-11 to 10-7 mbar
DN150CF (8" OD)