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SOFTWARE

3

SpecsLab Prodigy Version 4.86.2

TeamViewer Presentation Tool

TeamViewer Support Tool

BROCHURES

32

1D-DLD Detector

2D-CCD/3D-Spin VLEED Detector

2D-CMOS Detector

AM5 Audio Monitor

ASTRAIOS 190

Beam Chopper for PU-EQ 22

EQ 22/35 Electron Source

ErLEED 100/150

Evaporation Guide

FE-LEEM/PEEM P90 NAP

FE-LEEM/PEEM P90 Series

HESTIA ULT 6

KolibriSensor

PHOIBOS HV Series

Prodigy ISQAR

SPECS Systems NAP-XPS & NAP-SPM

SpecsLab Prodigy

SPM Aarhus Series

SPECS Broschuere Nanonis Tramea

UV Source Series

µFOCAL VUV OPTICS

µFOCUS 195

Microfocus 195

MANUALS

126

1D-DLD64-2-150 / 1D-DLD43-2-100

Double Delay Line Detector 1D-DLD43_2-100 1D-DLD64_2-150 — Double delayline detector 1D-DLD64_2-150 and 1D-DLD43_2-100 (Release 7c7 and Release 7e3) for use with PHOIBOS Hemispherical Analyzer Series - installation, operation and maintenance.

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2D-CCD Detector

2D CCD Detector — 2D detector for angle-resolved or spatially resolved studies with PHOIBOS hemispherical analyzers. Features a MCP Chevron/ phosphorous screen assembly and CCD camera sensor.

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2D-CCD/2D-Spin Mott Detektor

Combined Out-of-plane 2D Micro-Mott / 2D-CCD Detector — Detector for a wide range of 2D spin-dependent as well as angle-resolved or spatially resolved studies (spin and CCD mode) for use in conjunction with PHOIBOS hemispherical analyzers.

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2D-CCD/3D-Spin Mott Detektor

Combined Out-of-plane 3D Micro-Mott / 2D-CCD Detector — Detector for a wide range of 3D spin-dependent as well as angle-resolved or spatially resolved studies (spin and CCD mode) for use in conjunction with PHOIBOS hemispherical analyzers.

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2D-CCD/3D-Spin VLEED Detector

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2D-CMOS Detector

2D CMOS Detector — 2D Detector with high energy resolution, broad dynamic range and very low noise level for angle-resolved or spatially resolved studies. To be used with the hemispherical analyzers PHOIBOS 100/150/225, ASTRAIOS 150 and the KREIOS 150 spectrometer. Features a high speed CMOS camera and parallel true pulse counting.

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2D-DLD4040-100/150 & 2D-DLD6565-150

Delayline Detectors 3D-DLD4040-100/150 & 3D-DLD6565-150 — Delayline detector 3D-DLD4040-100, 3D-DLD4040-150 and 3D-DLD6565-150 (Release 5g, 5e2, and 5f2 for use with PHOIBOS Hemispherical Analyzer Series - installation, operation and maintenance.

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2D-DLD6565-150 HV

Delay Line Detector 3D-DLD6565-150 HV — Delayline detector 3D-DLD6565-150 HV (Release 4a and 4b) for use with PHOIBOS Hemispherical Analyzer Series - installation, operation and maintenance.

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Adjustable Camera Support

Adjustable Camera Support — Camera support - adjustment of torsion angle, height and x-y-position.

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AKBE Adaptation kit for Beetle-type SPMs

Nanonis AKBE Besocke Interface — Linking interface between the high voltage instruments of a Nanonis SPM controller and a microscope using a Besocke-type (or Beetle-type) head.

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AKOM4 Omicron Adaption Kit

AKOM User Manual — User Manual for the AKOM Omicron adaptation kit

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AM5 Audio Monitor

Nanonis Audio Monitor AM5 — Analog audio interface for Nanonis systems.

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Anode Supplement

Recommendations for the use of new anodes and anode inner tubes — Hints for installation and handling of new anodes and anode inner tubes that should be followed to prevent degraded performance.

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Beam Chopper for EQ22 and IQE12

Beam Chopper for EQ 22 and IQE 12 — Beam Chopper electronics for electron source EQ 22/35 and ion source IQE 12/38. To be used in conjunction with PU-EQ 22 and PU-IQE 12.

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BOC 1/8 Bakeout Controller

BOC 1/8 Bakeout Controller — Control unit for regulating the bake-out of SPECS UHV systems.

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Carving Manipulator Fitted with Stage for SH2/12 Sample Holders

Carving Manipulator Fitted with Stage for SH2/12 Sample Holders — Carving manipulator with rotational axes that intersect at the center of the sample surface - to be used with SH2/12 sample holders.

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Carving Manipulator Fitted with Stage for Stub Sample Holders

Carving Manipulator Fitted with Stage for Stub Sample Holders — Carving manipulator with rotational axes that intersect at the center of the sample surface - to be used with stub sample holders.

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Cassette Replacement TMM 304

Cassette for Monochromator TMM 304 — Handling and exchange for TMM 304 cassettes: Helium I/II, Xenon (with 1200 or 2400 grating) and Polarizer.

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CCX 125 Cooling Control Unit — Control and monitoring device for the water cooling of SPECS μ-Focus 350 X-ray source.

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CCX 70 Cooling Water Controller — Control and monitoring device for the water cooling of SPECS X-ray sources.

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COSCON FG Component Smart Control for Flood Gun — Component Smart Control power supply unit for the remote control of the low energy electron source FG 22/35 (flood gun).

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COSCON IS Component Smart Control for Ion Source — Component Smart Control power supply unit for the remote control of the ion source IQE 11/35 (sputter gun) - Remote Control Package available as an option.

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Customer Information Phosphor Schirm

UHV Phosphor Screens — Electron sensitive P20 phosphor screens used for beam alignment e.g. with FOCUS 500 X-Ray Monochromator - handling and specifications.

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DeviSim NAP

DeviSim NAP Near-Ambient Pressure Gas Cell and Manipulator — High-precision manipulator with gas cell for sample exposure in the near-ambient pressure range (NAP) - UHV pressures maintained in analysis chamber.

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DLD Device Driver Installation

Surface Concept DLD Device Driver Installation — Surface Concept DLD Device Driver for Windows 7 (64/ 32 bit) - installation.

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EBE-1 Electron Beam Evaporator

EBE-1 Single Pocket Electron Beam Evaporator — Electron beam evaporator with motorized shutter, capable of producing a high deposition flux of a wide range of evaporation materials. To be used in conjunction with the EBE S power supply.

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EBE-4 Electron Beam Evaporator

EBE-4 Four Pocket Electron Beam Evaporator — Electron beam evaporator with motorized shutter, capable of producing a high deposition flux of a wide range of evaporation materials. To be used in conjunction with the EBE M power supply.

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EBE-M Power Supply for EBE-4

EBE-M Power Supply for EBE-4 — Power supply for the electron beam evaporator EBE-4.

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EBE-S Power Supply for EBE-1

EBE-S Power Supply for EBE 1 — Power supply for the electron beam evaporator EBE-1.

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EC 10 Ethernet-CAN Adaptor — PC interface to CAN networks.

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EnviroESCA - Operating Procedures

EnviroESCA ELECTRON SPECTROSCOPY FOR CHEMICAL ANALYSIS UNDER ENVIRONMENTAL CONDITIONS - Operating Procedures — EnviroESCA base system operation—X-Ray photoelectron spectroscopy system for chemical analysis of solids, liquids, powders in a pressure range between UHV up to 100 mbar.

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EnviroESCA - System Description

EnviroESCA ELECTRON SPECTROSCOPY FOR CHEMICAL ANALYSIS UNDER ENVIRONMENTAL CONDITIONS - System Description — EnviroESCA base system description—X-Ray photoelectron spectroscopy system for chemical analysis of solids, liquids, powders in a pressure range between UHV up to 100 mbar.

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EQ 22 Pulsed Electron Source

EQ 22 Pulsed Electron Source Supplementary Manual — Pulse generator for high intensity electron source EQ 22.

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EQ 22/35 Electron Source

Electron Source EQ 22/35 — Stable electron gun providing high electron beam currents over a wide energy range. To be used in conjunction with the power supply PU-EQ 22/35.

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ErLEED 100/150

ErLEED 100/150 Reverse View Low Energy Electron Diffraction System — Low-Energy Electron Diffraction system with miniaturized electron gun and optics, offered in a 3- and 4-grid version. Used to obtain structural information about surfaces from LEED pattern and, optionally, Auger electron spectroscopy techniques, e.g. during the sample preparation. The system is available with two different flange sizes and a digital or analog electronic control device for the voltage supply, of which the digital version comes with the control and acquisition software "ErLEED RFA-PC".

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FE-LEEM P90

FE-LEEM P90 Low Energy Electron Microscope — Cold field emitter, low energy electron microscope vacuum system and operation.

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FE-LEEM P90 AC

FE-LEEM P90 AC Low Energy Electron Microscope — Cold field emitter, low energy electron microscope with 90° magnetic deflector prism (P90) and aberration corrector (AC).

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FE-LEEM P90 Sample Stage

Sample Stage Control for FE-LEEM P90 — FE-LEEM P90 sample stage with stepper motors and high precision linear sample positioners (X, Y, Z and tilt).

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FG 22 Flood Gun — Electron flood gun for sample irradiation with a current of low energy electrons.

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FG 22/35 Flood Gun

FG 22/35 Flood Gun — Electron Flood Gun for low energy electron applications (surface charge compensation).

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FG 500-A Flood Gun Power Supply — Power supply for the control of the electron source FG 22/35 (flood gun).

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FOCUS 500 X-Ray Monochromator — Ellipsoidal monochromator with high X-ray dispersion for use in conjunction with XR 50 M X-ray source. Features a 500 mm Rowland circle diameter.

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FOCUS 600 X-Ray Monochromator — Ellipsoidal monochromator with high X-ray dispersion for use in conjunction with XR 50 M X-ray source. Features a 600 mm Rowland circle diameter.

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GBU 100 Gun Bakeout Unit

GBU 100 Gun Bakeout Unit — Bake-out control for electron gun supplying a high power (outer) and a low power (inner) bake-out circuit.

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GUI Software

GUI - DLD Software — Test software for DLD graphical user interface.

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Heating Control Unit

Heating Control Unit HCU — Heating Control Unit for the Infra-red heater of the High Pressure Cell HPC-20.

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HPC-20 High Pressure Cell

HPC-20 High Pressure Cell — High Pressure Cell with infra-red (IR) sample stage heating and water-cooling of other parts in the reaction chamber allowing the vacuum chamber around the reaction volume to maintain UHV conditions.

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HSA 10000plus

HSA 10000 plus - Supplementary Manual — High precision voltage supply for voltages up to 10.5 kV with internal HV cage for electrical isolation. To be used for the control of selected PHOIBOS HV analyzers, release 7.

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HSA 3500plus

HSA 3500plus Power Supply — HSA 3500 family of power supplies including HSA 3500plus, HSA 7000plus and HSA 15000plus. To be used in conjunction with PHOIBOS Hemispherical Energy Analyzers and THEMIS Time-Of-Flight Spectrometers.

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HSA 7000plus

HSA 7000plus Supplementary Manual — High precision voltage supply (up to 7 kV), suitable for controlling PHOIBOS release 7 analyzers.

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HVA4 high-voltage amplifier for piezo scanners

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HVS4 High Voltage Supply

Nanonis High Voltage Supply HVS4 — Linear, precision regulated, low noise high voltage supply for SPM applications.

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Information Sheet MIO/DIO-Cable for Nanonis Devices

Where to Connect the Nanonis SC4 and OC4 to the Nanonis RC4 — SC4 / OC4 to RC4 connection scheme.

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Information Sheet Omicron Kit

Limited Voltages for Mirror Motors - Omicron VT-AFM or RT-AFM — Information about voltage limitation with Omicron Adaptation Kit for Nanonis SPM Control System on Omicron Variable Temperature AFM (VT-AFM) or Room Temperature AFM (RT-AFM).

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IQE 11/35 Ion Source — Ion source capable of producing positive ions with an energy of up to 5 kV (e.g. argon ions for sputtering), depending on the specification of the used power supply, either the PS IQE 11 A or the PU IQE 11/35.

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IQE 12/38 Ion Source — Ion source with deflectors for producing a focused, scannable ion beam, used with the power supply PU-IQE 12/38.

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IQE 12/38 Low Energy

IQE 12/38 LE Ion Source — Ion source with deflectors for producing a focused, scannable ion beam - low energy option available with specially modified version of the power supply PU-IQE 12/38.

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IQP 10-A Ion Source Power Supply — Power supply for controlling the IQP 10/63 cold cathode ion source.

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IQP 10/63 Ion Source — Cold cathode ion source suitable for sample cleaning and preparation. To be used with IQP 10-A power supply.

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IS-EC-AP In-Situ Electrochemistry Cell

IS-EC-AP Electrochemistry Cell — In-situ electrochemistry cell for sample surface preparation and electrochemical experiments in liquid electrolytes under ambient pressure conditions.

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Kolibri Starter Kit

KolibriSensor Starter Kit — Starter kit for the evaluation of a KolibriSensor without the need to mount it in a microscope (SPECS Aarhus SPM 150, SPECS JT-SPM and custom microscopes).

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L5 Programming

SPECS L5 Programming Manual — Remote client control for SPECS L5.

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Laser Pointer

Laser Pointer for Surface Analysis Systems — Precise positioning and alignment of samples or components like sources and analyzers within UHV chambers.

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SPECS L5 Control Software for SPECS FE-LEEM P90 — Software package for FE-LEEM P90 control and automated data acquisition.

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LPU-C LEEM Power Unit Current — Current generating unit for FE-LEEM-P90, to be used with the LPU-C PS.

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LPU-EGun Electron Gun Power Supply — Power supply for LEEM electron gun (manual mainly provided for test and servicing purposes).

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LPU-V18 18 kV Voltage Supply — Highly stable 18 kV power supply (e.g. for sample bias or electron gun high voltage), intended for use with SPECS low energy electron microscopes or PHOIBOS Hemispherical Analyzers.

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MCPS 36 Motor Control Power Supply — Power supply for Schneider Electric ILS1 integrated drives using the CANopen protocol.

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MCVA5 Multichannel Voltage Preamplifier

MCVA5 User Manual — User Manual for the Nanonis MCVA5 preamplifier

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Motor End Position Indicator MEPI

Specification Sheet for Motor End Position Indicator MEPI — Small, battery-powered device for checking STM coarse approach motor rear stop position on an SPC 260 (German).

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MPS-ECR Plasma Cracker Source — Microwave field mini plasma cracker source capable of producing ions, atoms or molecules in various excitation states (smaller version compared to PCS-ECS). To be used with MPS-ECR Power Supply or MPS-ECR Grid Power Supply.

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O-EC-NAP Operando Electrochemical Cell

O-EC-NAP Electrochemistry Cell and Manipulator — Operando electrochemistry cell and manipulator for electrochemical studies of sample surfaces in liquid electrolytes under UHV or NAP conditions.

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OC4 Oscillation Controller

Nanonis Oscillation Controller OC4 — Phase Locked Loop controller for accurately tracking the resonant frequency of a mechanical oscillator, designed primarily for dynamic mode atomic force microscopy.

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PCS-ECR Plasma Cracker Source — Microwave field plasma cracker source capable of producing ions, atoms or molecules in various excitation states. To be used with PCS-ECR Power Supply or PCS-ECR Grid Power Supply.

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PCS-RF Plasma Cracker Source — Radio frequency field plasma cracker source capable of producing atoms or ions used in surface preparation or treatment. To be used with PCS-ECR power supply or PCS-ECR grid power supply.

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PCS-RF Tuning Unit and Electronics for RF-Plasma Source

PCS-RF Tuning Unit and Electronics for RF-Plasma Source — Tuning unit and electronics for producing an inductively-coupled plasma in the PCS-RF plasma source.

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PHOIBOS 100/150

PHOIBOS 100/150 Hemispherical Energy Analyzer — High resolution spectrometer for XPS, UPS and ISS applications, suitable for measurements over a wide energy range, equipped with adjustable iris aperture and μ-metal shielding.

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PHOIBOS 150 NAP

PHOIBOS NAP Near Ambient Pressure Hemispherical Energy Analyzer — High resolution spectrometer for XPS, UPS and ISS applications, suitable for measurements over a wide energy range under near ambient analysis chamber pressures.

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PHOIBOS 150 WAL

PHOIBOS WAL Wide Angle Lens Hemispherical Energy Analyzer — High resolution spectrometer for XPS, UPS and ISS applications, suitable for measurements over a wide energy range, designed to allow angle resolved energy analysis of electrons or ions. which have a wide angular distribution.

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PHOIBOS 225

PHOIBOS Hemispherical Energy Analyzer Series PHOIBOS 225 — Extremely high resolution spectrometer for XPS, UPS and ISS applications with HSA mean radius of 225 mm. Suitable for measurements over a wide energy range and available with several detection options.

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PHOIBOS Classic

PHOIBOS Classic Hemispherical Energy Analyzer — High resolution spectrometer for XPS, UPS and ISS applications, suitable for measurements over a wide energy range.

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PHOIBOS EP Elevated Pressure Hemispherical Energy Analyzer — High resolution spectrometer for XPS, UPS and ISS applications, suitable for measurements over a wide energy range under elevated analysis chamber pressures.

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PMD4 Piezo motor driver

PMD4_User_Manual_R9651

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PPC 5 PicoProbe Controller

PPC 5 Pico Probe Controller — Modular picoammeter, controlling up to five Pico Probe measurement heads for measuring currents from a few picoamps up to 2 mA.

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PU IQE 11/35 - 3kV

PS IQE 11 A Power Supply for Ion Source — Power supply for ion source IQE 11/35.

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PU IQE 11/35 - 5kV

PU IQE 11/35 Ion Source Power Supply — Power supply intended for the IQE 11/35 ion source. Also compatible with other ion sources of similar operating principle.

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PU IQE 12/38 Power Supply

PU IQE 12/38 Ion Source Power Supply — Power supply intended for the IQE 12/38 ion source. Also compatible with other ion sources of similar operating principle.

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PU- EQ 22/35 Power Supply for EQ 22/35 - Supplement

Power supply for electron gun EQ 22/35 - Manual Supplement — Supplement to the main manual decribing the changed remote interface module of the power unit EQ 22/35.

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PU-EQ 22/35 Power Supply for EQ 22/35

PU-EQ 22/35 Power Unit EQ 22/35 — Power supply for electron gun EQ 22/35 or other electron guns that are based on the same physical working principle.

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PureGas 3 Computerized Multigas Inlet Panel — Computerized multigas inlet panel for mixing and regulating a number of gases.

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RC5 Real-Time Controller

Nanonis Real-Time Controller RC5 — Real-time data processing unit for Nanonis systems.

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RC5e Real-Time Controller

Nanonis Real-Time Controller — Nanonis Real-Time Controller RC5e User Manual

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RHD-30 RHEED Gun and Power Supply — High energy electron gun (and power supply) that produces a focused, steerable electron beam used to determine surface structures of samples based on the reflection high-energy electron diffraction technique.

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Safety Bulletin UXC 1000, XR 50 MF

UXC1000 / CCX70 Customer Bulletin: Checking for Safe Operation — Safety bulletin for UXC 1000 / CCX 70 with XR 50 MF, intended to help meet safety requirements for the purpose of risk reduction.

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Safety Bulletin for XRC 1000 (M) / CCX 60 with XR 50 (M)

XRC1000 M / CCX60 Customer Bulletin: Checking for Safe Operation — Safety bulletin for XRC 1000 (M) / CCX 60 with XR 50 (M), intended to help meet safety requirements for the purpose of risk reduction.

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Safety Bulletin UXC 1000, XR50, XR50M

UXC1000 / CCX70 Customer Bulletin: Checking for Safe Operation — Safety bulletin for UXC 1000 / CCX 70 with XR 50 M / XR 50 M, intended to help meet safety requirements for the purpose of risk reduction.

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Sample Environment

Sample Environment for EnviroESCA—Button / Peltier Configuration — Button / Peltier version of the exchangeable module for the high-throughput XPS analysis system EnviroESCA. Designed for sample handling and temperature control in UHV, EP and NAP environments.

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Sample Environment with Laser Heater

Sample Environment with Laser Heating — Laser heating version of the exchangeable module for the high-throughput XPS analysis system EnviroESCA. Designed for sample handling and temperature control in UHV, EP and NAP environments.

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SC5 Signal Conversion

Nanonis Signal Conversion SC5 — Signal conversion interface for Nanonis systems.

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SCD/ MCD-5/ MCD-9 Detector

SCD/ MCD-5/ MCD-9 Channel Electron Multiplier Detectors — Single and multichannel detectors containing electron multipliers (CEMs) used to detect electrons or ions with SPECS PHOIBOS hemispherical analyzers.

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SO5 Signal Output

Nanonis Signal Output Interface SO5 — High-performance voltage source for high resolution, high precision applications requiring low noise, low drift and multiple-channel functionality.

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Software THEMIS 600/1000

SpecsThemis Software for THEMIS 600 / 1000 — Data acquisition and data processing program for the Time-of-flight-spectrometers THEMIS 600 and THEMIS 1000.

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SPC-260 Control for STM 150

SPC 260 Control for STM 150 — Control electronics and software for STM 150.

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SPIN-Detector

Spin Detector — Mott / MCD spin detector, to be used in conjunction with PHOIBOS 150 hemispherical analyzers.

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SPM 150 Aarhus — Extremely stable, versatile scanning probe microscope with miniaturized design supporting fast scan rates.

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STM 150 NAP

STM 150 NAP Near Ambient Pressure STM — Scanning tunneling microscope for operation from UHV to near ambient pressures (NAP) of up to 100 mbar.

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TGC-H Thermal Gas Cracker — Thermal gas cracker that dissociates gas molecules into atoms, yielding a beam of hydrogen (oxygen) atoms.

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THEMIS 1000

THEMIS 1000 Time-Of-Flight Spectrometer — Time-of-flight spectrometer for pulsed excitation (photon, electron) sources.

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THEMIS 600/1000

THEMIS Time-of-Flight Spectrometer THEMIS 600 / THEMIS 1000 — Time-of-Flight spectrometer series with 3D delayline detector and electron lens optimized for experiments ranging from extreme resolution spectroscopy to high transmission snapshots.

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TMM 304 UV Monochromator — VUV monochromator and polarizer for ultraviolet light originating from gas discharge type sources. To be used for sample surface irradiation in conjunction with ultraviolet (UV) light sources like the UVS 300 or the UVLS.

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Nanonis Tramea Quantum Transport Measurement System — Compact and modular (customizable), software-controlled quantum measurement platform with high-resolution AD/DA conversion, signal conditioning and fast signal processing. Comprises RC5 real-time controller and SC5 signal conversion interface.

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UVLS 600 Power Supply

UVLS 600 Microwave Ultraviolet Light Source Power Supply — Power supply for compact, high-intensity ultraviolet source.

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UVLS Microwave Ultraviolet Light Source

UVLS Microwave Ultraviolet Light Source — Compact, high-intensity ultraviolet source.

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UVS 10/35 Ultraviolet Source — High intensity gas discharge lamp producing UV and VUV radiation for UPS experiments.

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UVS 20A Power Supply

UVS 20A Ultraviolet Source Power Supply — Power supply for the high intensity discharge lamp UVS 10/35, used for Ultraviolet Photoelectron Spectroscopy (UPS) experiments.

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UVS 300 High Intensity VUV Lamp — Very high intensity gas discharge lamp producing VUV radiation suitable for UPS experiments.

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UXC 1000 Universal X-Ray Controller for XR 50

UXC 1000 Universal X-Ray Controller for XR 50 — Power supply for controlling the XR 50 X-ray source.

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UXC 1000 Universal X-Ray Controller for XR 50 M

UXC 1000 Universal X-Ray Controller for XR 50 M — Power supply for controlling the XR 50 M X-ray source.

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UXC 1000 Universal X-Ray Controller for XR 50 MF

UXC 1000 Universal X-Ray Controller for XR 50 MF — Power supply for controlling the μ-FOCUS X-ray source.

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Wien Mass Filter

Wien Mass Filter for SPECS IQE 12/38 WF-IQE — Compact Wien Filter (and power supply PS-WF) for ion source IQE 12/38 that selects defined ions and suppresses impurities and neutrals in depth profiling applications.

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XR 50 / XR 50 NAP X-Ray Source

XR 50 / XR 50 NAP X-Ray Source — X-ray source with twin anode optimized for XPS measurements.

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XR 50 M Monochromatic X-Ray Source

XR 50 M X-Ray Source — X-ray source for use with FOCUS 500/600, with twin anode optimized for XPS measurements.

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XR-MF / XR-MF NAP Microfocus X-Ray Source

XR-MF Microfocus X-Ray Source — High intensity X-ray source with small spot size.

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XRC-125 MF Power Supply for μ-Focus 350 — XRC-125 MF Control Unit and XRC-125 MF HV Unit - power supplies for the μ-FOCUS 350 X-ray source.

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µ-FOCUS 350

μ-FOCUS 350 Small Spot X-Ray Monochromator — High-intensity, small-spot, monochromated X-ray source.

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µFOCUS 730 HE

μFOCUS 730 HE Small Spot High Energy Monochromator

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APPLICATION NOTES

4

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