Detail

Nanoparticles

Functional Nanoparticles have a plethora of applications based on their special physical and chemical properties: high reactivity, biocide action, optical and electronic properties. A characterization by (NAP)-XPS, LEEM, PEEM and SPM give important inside into the quality of nanoparticles.

RELATED PRODUCTS

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µFOCUS 450

µFOCUS 450 Multi Wavelength Small Spot X-Ray Monochromator

µFOCUS 500/600

µFOCUS 500/600 Small Spot X-Ray Monochromator

µ-FOCUS 350

µ-FOCUS 350 Small-Spot X-Ray Monochromator

Mimea base package BP5e

The expandable engine for your SPM project

Function generator

Single or dual-channel function generator driving all outputs of the SC5 and SO5

Scripting module

Script your own high-speed measurement sequences

STM simulator

Your test and training environment for SPM experiments

Plenty of outputs for multiprobe applications (for BP5/BP5e)

Plenty of signals for extended data Acquisition (for BP5/BP)

Programming interface

Nanonis programming interface PI 5

PMD4-BNC adapter

BNC adapter for PMD4

PMD4 piezo motor driver

High current piezo motor driver

Oscillation Control Software

The new cockpit for AFM experiments

Programming interface

Nanonis programming interface for OC4.5 station

OC4 oscillation controller

For the finest control of mechanical oscillators

Lock-in modules

High-performance digital lock-in amplifiers

Kelvin controller

Bias voltage regulation for contact potential measurements

Interferometer controller

For precise control of interferometric deflection detection

Signal adder 4

For spectroscopy measurements with external lock-ins

Mimea upgrade from BP3 to BP5e

Trade-in your V3 controller and get the newest V5e system

Multimethod System with XPS, SPM and UHV Prepration

Multimethod System with Preparation, XPS and SPM

XPS System with UHV and High Pressure Prepration

Multimethod System with Preparation, HPC and XPS

SPM Aarhus 150 NAP

Highest stability STM/AFM for near ambient pressure

SPM Aarhus 150

Highest stability STM/AFM for ultimate productivity

Z modulator

Adds an AC modulation to the Z high voltage signal

Software upgrade to Nanonis Tramea

Switch between scanning probe and quantum transport

Mimea upgrade for OC4.5 station

Upgrade from a standalone PLL to a full SPM control system

Mimea upgrade from BP4 to BP5e

Trade-in your V4 controller and get the newest V5e system

High-resolution oscilloscope module

High resolution oscilloscope and FFT module OS5

HVS4 high voltage power supply

High voltage power supply for HVA4, PMD4, PD5

FEMTO DLPCA-200

FEMTO DLPCA-200 preamp kit/cable kit

FEMTO DHPCA-100

FEMTO DHPCA-100 preamp kit/cable kit

FEMTO DDPCA-300

FEMTO DDPCA-300 preamp kit/cable kit

FE-LEEM/PEEM P90 NAP

Near Ambient Pressure Low Energy Electron Microscope

FE-LEEM/PEEM P90 AC

Aberration Corrected LEEM/PEEM System

FE-LEEM/PEEM P90

High Resolution LEEM/PEEM System

Adaptation kit Veeco

Veeco Multimode adaptation kit

Adaptation kit Unisoku

Adaptation kit for Unisoku SPMs

Adaptation kit SPECS

Adaptation kit for SPECS Aarhus SPM

Adaptation kit Omicron

Adaptation kit for Omicron STM/AFM

Adaptation kit JEOL

Upgrade the latest JEOL SPM with a Nanonis SPM controller

Adaptation kit JEOL

For JEOL 4000 and 5200 series UHV AFM/STM

Adaptation kit Createc

Adaptation kit for Createc SPMs

Adaptation kit Beetle

Adaptation kit for Beetle-type SPM heads

SPECS KolibriPreamp

Highly reliable low noise preamplifier for KolibriSensor

System Module for Scanning Probe Microscopy

HVA4-BNC Adapter

BNC adapter for HVA4

HVA4 High voltage amplifier

Low-noise high-voltage amplifier for piezo scanners

Generic PI controller

Configurable digital PI-Controllers GP 5

Audio Monitor AM5

The Sound of Atoms

Atom tracking

Atom tracking module for automatic drift compensation

AUX modulator

Adds an AC modulation to the AUX high voltage signal

5 to 4 Quadrant adapter

Sums Z into X and Y channels for 4-quadrant piezo operation

NAP-SPM system

Scanning Probe Microscope for Near Ambient Pressure

Multimethod System with XPS, LEEM and SPM

Multimethod Cluster System with XPS, LEEM and SPM

Multimethod Surface Analysis System Cluster

Multimethod Cluster with ARPES, SPM, LEEM and IonTof Qtac

System Module for Photoelectron Spectroscopy

Multimethod System with ARPES, LT-SPM and UHV Preparation

Multimethod ARPES/LT-SPM System for Surface Analysis

APPLICATION NOTES

XPS surface chemical analysis of aqueous solutions with EnviroESCA

XPS surface chemical analysis of aqueous solutions with EnviroESCA

In this study we present the capabilites of EnviroESCA to analyze the surface of various aqueous solutions under near ambient pressure conditions. Such investigations of aqueous solutions are of paramount importance due to the vast number of essential water based processes in nature and industry.

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