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Surface Topography

Surface topography influences important parameters of materials. The classical methods to image the topography are STM and AFM.

RELATED PRODUCTS

55
Mimea base package BP5e
The expandable engine for your SPM project
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Multimethod System with XPS, SPM and UHV Prepration
Multimethod System with Preparation, XPS and SPM
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SO5 add-on
Plenty of outputs for multiprobe applications (for BP5/BP5e)
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SC5 add-on
Plenty of signals for extended data Acquisition (for BP5/BP)
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Programming interface
Nanonis programming interface PI 5
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PMD4-BNC adapter
BNC adapter for PMD4
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PMD4 piezo motor driver
High current piezo motor driver
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Oscillation Control Software
The new cockpit for AFM experiments
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OC4.5 station
For the finest control of mechanical oscillators
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Programming interface
Nanonis programming interface for OC4.5 station
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OC4 oscillation controller
For the finest control of mechanical oscillators
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Lock-in modules
High-performance digital lock-in amplifiers
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Kelvin controller
Bias voltage regulation for contact potential measurements
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Interferometer controller
For precise control of interferometric deflection detection
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STM simulator
Your test and training environment for SPM experiments
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Scripting module
Script your own high-speed measurement sequences
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Signal adder 4
For spectroscopy measurements with external lock-ins
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XPS System with UHV and High Pressure Prepration
Multimethod System with Preparation, HPC and XPS
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SPM Aarhus 150 NAP
Highest stability STM/AFM for near ambient pressure
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SPM Aarhus 150
Highest stability STM/AFM for ultimate productivity
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Z modulator
Adds an AC modulation to the Z high voltage signal
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Software upgrade to Nanonis Tramea
Switch between scanning probe and quantum transport
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Mimea upgrade for OC4.5 station
Upgrade from a standalone PLL to a full SPM control system
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Mimea upgrade from BP4 to BP5e
Trade-in your V4 controller and get the newest V5e system
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Mimea upgrade from BP3 to BP5e
Trade-in your V3 controller and get the newest V5e system
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High-resolution oscilloscope module
High resolution oscilloscope and FFT module OS5
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HVS4 high voltage power supply
High voltage power supply for HVA4, PMD4, PD5
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FEMTO DHPCA-100
FEMTO DHPCA-100 preamp kit/cable kit
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FEMTO DDPCA-300
FEMTO DDPCA-300 preamp kit/cable kit
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FE-LEEM/PEEM P90 NAP
Near Ambient Pressure Low Energy Electron Microscope
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FE-LEEM/PEEM P90 AC
Aberration Corrected LEEM/PEEM System
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FE-LEEM/PEEM P90
High Resolution LEEM/PEEM System
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Adaptation kit Veeco
Veeco Multimode adaptation kit
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Adaptation kit Unisoku
Adaptation kit for Unisoku SPMs
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Adaptation kit SPECS
Adaptation kit for SPECS Aarhus SPM
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Adaptation kit Omicron
Adaptation kit for Omicron STM/AFM
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Adaptation kit JEOL
Upgrade the latest JEOL SPM with a Nanonis SPM controller
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Adaptation kit JEOL
For JEOL 4000 and 5200 series UHV AFM/STM
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Adaptation kit Createc
Adaptation kit for Createc SPMs
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Adaptation kit Beetle
Adaptation kit for Beetle-type SPM heads
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FEMTO DLPCA-200
FEMTO DLPCA-200 preamp kit/cable kit
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SPECS KolibriPreamp
Highly reliable low noise preamplifier for KolibriSensor
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FlexPM
System Module for Scanning Probe Microscopy
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HVA4-BNC Adapter
BNC adapter for HVA4
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HVA4 High voltage amplifier
Low-noise high-voltage amplifier for piezo scanners
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Generic PI controller
Configurable digital PI-Controllers GP 5
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Audio Monitor AM5
The Sound of Atoms
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Atom tracking
Atom tracking module for automatic drift compensation
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AUX modulator
Adds an AC modulation to the AUX high voltage signal
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5 to 4 Quadrant adapter
Sums Z into X and Y channels for 4-quadrant piezo operation
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NAP-SPM system
Scanning Probe Microscope for Near Ambient Pressure
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Multimethod System with XPS, LEEM and SPM
Multimethod Cluster System with XPS, LEEM and SPM
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Multimethod Surface Analysis System Cluster
Multimethod Cluster with ARPES, SPM, LEEM and IonTof Qtac
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FlexPS
System Module for Photoelectron Spectroscopy
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Multimethod System with ARPES, LT-SPM and UHV Preparation
Multimethod ARPES/LT-SPM System for Surface Analysis
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