Detail

Coatings & Thin Films

Thin films are used in many applications, especially in device technology in semicoductor industry. XPS and HAXPES can help to characterize the chemical composition of surfaces and interfaces, while LEEM, PEEM and SPM can measure the structure of surfaces. A correlation to the electronic properties, that can be measured by UPS or ARPES, helps to correlate device performance to materials properties in order to optimize materials choice and combinations.

Coatings and platings are widely used in optics manufacturing and metal refinement as they optimize the surface properties of materials to make them harder, stronger and more durable. The coatings are thin films which interact with the substrate on one side and the gaseous or liquid Environment on the other. NAP-XPS can analyse the chemical composition and reactivity of coatings.

RELATED PRODUCTS

80

AD-CMOS Detector

Adaptive Dimensions True Pulse Counting CMOS Detector

Power Supply for FG 22/35

Radio Frequency Hybrid Plasma Source for Reactive Gases

OC4 oscillation controller

For the finest control of mechanical oscillators

Scripting module

Script your own high-speed measurement sequences

Signal adder 4

For spectroscopy measurements with external lock-ins

Mimea upgrade from BP3 to BP5e

Trade-in your V3 controller and get the newest V5e system

Mimea upgrade from BP4 to BP5e

Trade-in your V4 controller and get the newest V5e system

Mimea upgrade for OC4.5 station

Upgrade from a standalone PLL to a full SPM control system

Software upgrade to Nanonis Tramea

Switch between scanning probe and quantum transport

Z modulator

Adds an AC modulation to the Z high voltage signal

STM simulator

Your test and training environment for SPM experiments

Plenty of outputs for multiprobe applications (for BP5/BP5e)

Programming interface

Nanonis programming interface for OC4.5 station

OC4.5 station

For the finest control of mechanical oscillators

Oscillation Control Software

The new cockpit for AFM experiments

PMD4 piezo motor driver

High current piezo motor driver

PMD4-BNC adapter

BNC adapter for PMD4

Programming interface

Nanonis programming interface PI 5

Plenty of signals for extended data Acquisition (for BP5/BP)

Power Supply for PCS-ECR Microwave Plasma Sources

Microwave Atom Plasma Source for Reducing Gases

Microwave Atom Plasma Source for Reactive Gases

PHOIBOS 150 WAL 2D-CMOS/-CCD

Super Wide Angle Analyzer for ARXPS with CMOS Detector

PHOIBOS 150 WAL 2D-DLD

Super Wide Angle Analyzer for ARXPS with 2D DLD Detector

Power Supply for TGC-H Thermal Gas Cracker Source

High Energy Electron Gun for RHEED

Thermal Gas Cracker Source for Hydrogen Atoms

Multimethod System with XPS and INA-X (SIMS/SNMS)

Multimethod System with INA-X and XPS

PCS-RF-PS (300/600/MT/AT)

Power Supply for PCS-RF Radio Frequency Plasma Sources

Radio Frequency Ion Plasma Source for Reactive Gases

Microwave Hybrid Plasma Source for Reducing Gases

Microwave Hybrid Plasma Source for Reactive Gases

Microwave Ion Plasma Source for Reducing Gases

Microwave Ion Plasma Source for Reactive Gases

Radio Frequency Atom Plasma Source for Reducing Gases.

Radio Frequency Atom Plasma Source for Reactive Gases

Radio Frequency Hybrid Plasma Source for Reducing Gases

Radio Frequency Ion Plasma Source for Reducing Gases

Function generator

Single or dual-channel function generator driving all outputs of the SC5 and SO5

Adaptation kit Beetle

Adaptation kit for Beetle-type SPM heads

FEMTO DHPCA-100

FEMTO DHPCA-100 preamp kit/cable kit

FEMTO DLPCA-200

FEMTO DLPCA-200 preamp kit/cable kit

SPECS KolibriPreamp

Highly reliable low noise preamplifier for KolibriSensor

System Module for Sample Preparation

Multimethod System with XPS, PVD and Sputter Deposition

Multimethod Cluster with XPS, PVD and Sputter Deposition

Multimethod System with XPS, Preparation and Sputter Deposition

Cluster System with XPS Preparation and Sputter Deposition

SPECS MBE System for Sample Preparation

FEMTO DDPCA-300

FEMTO DDPCA-300 preamp kit/cable kit

EBE-4 Configurable

Multi-Pocket Electron Beam Evaporator for Thin Film Deposition of Highest Purity

Adaptation kit Createc

Adaptation kit for Createc SPMs

Adaptation kit JEOL

For JEOL 4000 and 5200 series UHV AFM/STM

Adaptation kit JEOL

Upgrade the latest JEOL SPM with a Nanonis SPM controller

Adaptation kit Omicron

Adaptation kit for Omicron STM/AFM

Adaptation kit SPECS

Adaptation kit for SPECS Aarhus SPM

Adaptation kit Unisoku

Adaptation kit for Unisoku SPMs

Adaptation kit Veeco

Veeco Multimode adaptation kit

Single-Pocket Electron Beam Evaporator for Thin Film Deposition of Highest Purity

Mini Microwave Atom Plasma Source for Reducing Gases

Mini Microwave Atom Plasma Source for Reactive Gases

Mini Microwave Hybrid Plasma Source for Reducing Gases

Generic PI controller

Configurable digital PI-Controllers GP 5

HVA4 High voltage amplifier

Low-noise high-voltage amplifier for piezo scanners

HVA4-BNC Adapter

BNC adapter for HVA4

HVS4 high voltage power supply

High voltage power supply for HVA4, PMD4, PD5

High-resolution oscilloscope module

High resolution oscilloscope and FFT module OS5

Interferometer controller

For precise control of interferometric deflection detection

Kelvin controller

Bias voltage regulation for contact potential measurements

Mini Microwave Hybrid Plasma Source for Reactive Gases

Mini Microwave Ion Plasma Source for Reducing Gases

Mini Microwave Ion Plasma Source for Reactive Gases

Near Ambient Pressure RHEED

5 to 4 Quadrant adapter

Sums Z into X and Y channels for 4-quadrant piezo operation

AUX modulator

Adds an AC modulation to the AUX high voltage signal

Atom tracking

Atom tracking module for automatic drift compensation

Audio Monitor AM5

The Sound of Atoms

Lock-in modules

High-performance digital lock-in amplifiers

Extractor Type Low Energy Ion Source

Extractor Type Scannable Ion Source

IQE 12/38 Wien Filter

IQE 12/38 Wien Filter (4800 and 1000 Gauss) + Power Supply

APPLICATION NOTES

Sputter Depth Profiling of Iodine in Organic Thin Films

Sputter Depth Profiling of Iodine in Organic Thin Films

This application note presents how the optional GCIB source of the EnviroESCA can be used for sputter depth profiling of iodine-containing (bio)organic thin film samples using Argon cluster Arn+ (n= 500-5000).

Operando NAP-XPS study of plasma-enhanced surface reactions

Operando NAP-XPS study of plasma-enhanced surface reactions

First results of an operando NAP-XPS experiment on a silver surface during an air plasma cleaning process are presented. The observed chemical changes are plasma-induced and monitored under working conditions.

Investigation of Hydrogel Contact Lenses with EnviroESCA

Investigation of Hydrogel Contact Lenses with EnviroESCA

In this application note we analyze the surface of water filled hydrogels with EnviroESCA, Here, contact lenses serve as an example for medical and biomaterials. The advantage of such investigations under non ultrahigh vacuum conditions is demonstrated and results from wet and dry samples are compared.

Gas Cluster Ion Beam (GCIB) sputtering with EnviroESCA

Gas Cluster Ion Beam (GCIB) sputtering with EnviroESCA

This application note presents how the optional GCIB source at the EnviroESCA can be used to clean samples prior to XPS analysis to get reproducible analytical data and reliable quantification results. Moreover, Argon cluster Arn⁺ (n=500-5000) sputtering and depth profiling of (bio)organic samples is possible which cannot be done when using monoatomic Arn+ sputtering.

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