Automated XPS for Surface and Interface Analysis

EnviroMETROS LAB is an automated XPS system for reproducible surface and interface analysis, combining XPS, HAXPES, PARXPS and complementary techniques.

XPS Wafer Metrology for Multilayer Characterization

EnviroMETROS FAB focuses on photoelectron spectroscopy for direct analysis of elemental composition, oxidation states, chemical bonding and depth-dependent interface chemistry.

Near-Ambient Pressure XPS for Operando Analysis

EnviroESCA is a unique, near-ambient pressure XPS and HAXPES system for surface chemical analysis of solids, liquids and their interfaces with gases.

Demo Measurements

Explore the capabilities of EnviroMETROS at our Berlin facility and send us your samples or bring them along for demo measurements on-site

Enviro evolves product quality and innovation.

EnviroMETROS combines non-destructive XPS analysis of surfaces, ultra-thin layers and buried interfaces with complementary analytical techniques. EnviroESCA enables in situ and operando studies of materials under controlled, application-relevant environments.

Advanced Analysis Made Accessible

Enviro delivers automated and intuitive solutions for advanced metrology and surface analysis. Fully integrated platforms and simplified workflows allow users to focus on scientific discovery, materials development and reliable process control.

PRODUCTS

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