Ultralinear Adaptive Dimensions True Pulse Counting CMOS Electron and Ion Detector
The AD-CMOS detector is a new generation of adaptive detector technology for surface analytics. Using a powerful single event detection mechanism, the AD-CMOS detector is a powerful electron and ion detector with adaptive dimensions, highest linearity and detection efficiency and fast acquisition speed.
The detector is based on an MCP-Chevron stack with a fast phosphorous screen originally developed for electronic structure evaluation and time resolved spectroscopy. A CMOS camera acquires images on which an algorithm identifies single electron events. The result is a true quantitative electron counting detector with outstanding linearity and easily configurable detection scheme. The new AD-COS detector was upgraded to a larger diameter enhance the detection capabilities and performance.
Switching from a multichannel one-dimensional operation mode (e.g. for XPS and UPS) to a two dimensional operation for angular resolved studies (e.g. ARXPS) and imaging techniques (e.g. slap imaging) is easily possible. The channel configuration is flexible and adaptive to the respective task, e.g. scanning mode, snapshots mode.
The AD-CMOS is retrofittable to any new SPECS analyzer, especially the PHOIBOS 150, PHOIBOS 150 NAP and PHOIBOS WAL.
|Count Rate Linearity Range|
> 10 MCPS
< 10 cps (Full Detector)
|Max. Count Rate|
> 15 Mcps
|XPS Count Rates UHV|
1.2 Mcps @ 0.85 eV FWHM (Ag3d5/2 100W MgKα)
|Number of Channels|
> 500 Energy Channels
|Active Detector Area|
|Type of Detector|
True Pulse Counting 2D Detector
PHOIBOS 150 Series