Scanning Probe Microscopy, Low Energy Electron Microscopy and Photoemission Electron Microscopy

For decades, Scanning Probe Microscopy (SPM), Low Energy Electron Microscopy (LEEM) and Photoelectron Emission Microscopy (PEEM) have been proven techniques for studying properties at the micro- and nano-scale. Characterization of new materials, nanomaterials and nanostructures require different types of information to determine their properties, and structural information is very important to understand growth, electronic structure or reactivity. This information can be obtained by microscopic methods. Additionally, these techniques yield spectroscopic information, and when combined, the resulting spectro-microscopic data provides an integrated and comprehensive insight into materials properties.

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