Scanning Probe Microscopy, Low Energy Electron Microscopy and Photoemission Electron Microscopy

Characterization of new materials, nanomaterials and nanostructures require different type of information to determine their properties. Structural information is very important to understand growth, electronic structure or reactivity. Such information can only be obtained by microscopic methods. Since many decades Scanning Probe Microscopy (SPM), Low Energy Electron Microscopy (LEEM) and Photoelectron Emission Microscopy (PEEM) are proven techniques for this purpose. Furthermore these techniques also allow for additional spectroscopic information. By the combination, such spectro-microscopic data provide a holistic inside into materials properties.