Logo specsDetail

XR 50 System Adaptation Kit

UHV Z-shift for XR-50 X-Ray Source with 50/100 mm Travel

XR 50 System Adaptation Kit is a z-shift for XR-50 X-ray sources with z-travel selectable between 50 mm or 100 mm. Insertion depth range depends on the application.

KEY FEATURES

  • Suitable for XR 50 X-ray sources
  • Z-travel selectable from 50 mm or 100 mm
  • Variable insertion depth range

MADE FOR THESE METHODS

2
NAP-XPS and NAP-UPS
X-ray Photoelectron Spectroscopy (XPS) and Ultraviolet Photoelectron Spectroscopy (UPS) are well-established and versatile techniques commonly used...
XPS, Chemical Mapping
X-ray photoelectron spectroscopy (XPS) is a widely used method for chemical analysis. By surface imaging or mapping a chemical map can be recorded
Close
Your web browser is deprecated
This could effect the presentation and some functions of our website.