Detail

EnviroMETROS

RELATED PRODUCTS

EnviroMETROS FAB

Novel hybride surface metrology for wafer handling systems

EnviroMETROS LAB

Novel hybride surface metrology for laboratory environments

APPLICATION NOTES

Non-destructive depth profiles by Parallel Angle-Resolved XPS (PARXPS)

Non-destructive depth profiles by Parallel Angle-Resolved XPS (PARXPS)

Parallel angle-resolved XPS is a powerful tool for obtaining non-destructive surface depth profiles of layered thin-film samples.

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