XII Workshop on Applications of Scanning Probe Microscopy

The main goal of the Workshop series is to gather scientists who are or who would like to be involved in surface science research using Scanning Probe Microscopy (SPM). These SPM methods include Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), and other related techniques operating in ultra-high vacuum environment and liquid/gas atmospheres. We wish the Workshop to be an interdisciplinary meeting for participants representing different theoretical and experimental disciplines of scientific research.