SCI XPS

X-ray Photoelectron Spectroscopy (XPS) is a surface sensitive analytical technique by which materials may be studied to obtain chemical and electronic information pertaining to the outermost layers of a sample. This event is aimed at bringing XPS to the attention of researchers in industry in the materials sector, introducing applications and methods in ways XPS may solve problems. Industrially relevant examples will be used and complementary techniques such as ion-scattering and reflective electron energy loss spectroscopy will be introduced also. The talks will include two UK based instrument manufacturers and view on XPS from Johnson Matthey.