12th International Symposium on Atomic Level Characterizations for New Materials and Devices '19
The series of international symposia entitled “Atomic Level Characterization (ALC)” started in 1996 with the meeting in Kyoto, Japan under the auspices of the 141st Committee on Microbeam Analysis of the Japan Society for the Promotion of Science (JSPS). The ALC symposia focus on practical applications of atomic level characterization (both atomic dimensions and energy levels) of new materials and devices, including bio- and organic materials as well as inorganics. Descriptions of new applications and instrumentation for various analytical techniques of surface and interface analysis are solicited in these symposia. The goal is to promote stimulating discussions among researchers specializing in different probe methods. The symposium also encourages discussion of fundamental problems to be solved in the further development of atomic level characterization of materials, including approaches based on theory and simulations.