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SEM/SAM Systems

Auger Electron Spectrosopy is still widely used as an alternative to XPS for surface chemical analysis. Because of the by 2 to 3 orders of magnitude smaller small spot sizes, that electron sources can reach in comparison to X-ray sources, the analysis area is much smaller. Even so small, that an SEM image can be recorded and correlated to the elemental distribution. Often a combination with XPS and UPS makes sense to obtain additonal information on surface potentials and the electronic structure.

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PUBLICATIONS

  1. (2021) In situ identification of the metallic state of Ag nanoclusters in oxidative dispersion
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  2. (2021) Stacking Relations and Substrate Interaction of Graphene on Copper Foil
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  3. (2020) Silicon Carbide Stacking-Order-Induced Doping Variation in Epitaxial Graphene
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  4. (2015) Low-Energy Electron Potentiometry: Contactless Imaging of Charge Transport on the Nanoscale
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