Focus – Instruments for Electron Spectroscopy and Surface Analysis

Focus stands for technological top-tier components for Electron Spectroscopy in Surface Science, one of the world's most complex research areas. 

Established in 1990 under the identical company name, Focus was driven by a highly educated and motivated team of physicists and engineers committed to pushing the boundaries of solutions for new materials research. A major product launch was made in 1998 with the introduction of the first commercial Time-of-Flight Photoemission Electron Microscope (TOF-PEEM), followed by the patented NanoESCA in 2005, a system that significantly enhanced energy resolution for imaging. 

In 2006, Focus pioneered the integration of Momentum Microscopy using NanoESCA & TOF-PEEM. It marked a milestone in the visualization of electronic band structures. Furthermore in 2011 the first commercial VLEED detector for highly sensitive spin-polarization measurements was released. 

Focus`strong commitment to technological leadership continues with the newest generation of instruments, such as the advanced TOF-MARIS introduced in 2023, which refines Time-of-Flight momentum microscopy.

The dedication of Focus to drive innovation is reflected by a deep connection to the global research community.